Palo Alto, CA, United States of America

Francois Mesqui


Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 78(Granted Patents)


Company Filing History:


Years Active: 2003-2004

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3 patents (USPTO):Explore Patents

Title: Innovations by Francois Mesqui

Introduction

Francois Mesqui is a notable inventor based in Palo Alto, California. He has made significant contributions to the field of imaging and inspection technologies, holding three patents to his name. His work focuses on enhancing the efficiency and accuracy of log inspection and container scanning.

Latest Patents

One of his latest patents is for a method and apparatus for multi-view x-ray imaging of logs. This innovative technique allows for the mapping of relevant material properties of a log, such as knot location and extent. The method reveals the outer shape of the log under the bark and accurately maps the boundary between heartwood and sapwood. The apparatus utilizes three x-ray sources and arrays of x-ray detectors to measure the attenuation of the wood in the log. Deviations in attenuation are related to changes in density, which indicate knots and other defects. This technology aids in making improved sawing decisions at the headrig of a sawmill, ultimately enhancing the yield of high-quality lumber from a given log. Additionally, he has developed a nonintrusive inspection apparatus that employs an x-ray technique capable of inspecting 600 containers an hour. This compact and easily maintainable apparatus features radiation locking with active curtains, continuous scanning, and efficient air conditioning.

Career Highlights

Francois Mesqui has made a significant impact in the field of technology through his innovative patents. His work at Invision Technologies, Inc. has positioned him as a leader in developing advanced inspection systems. His inventions have not only improved operational efficiency but have also contributed to the safety and quality of materials processed in various industries.

Collaborations

Francois has collaborated with notable professionals in his field, including Gerhard Fenkart and David E Kresse. These collaborations have further enhanced the development and implementation of his innovative technologies.

Conclusion

Francois Mesqui's contributions to imaging and inspection technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of material properties and the need for efficient inspection methods. His work continues to influence the industry positively.

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