Inspekto A.m.v. Ltd.

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USPTO Granted Patents = 6

EPO Patents = 1

Trademarks = 2

Forward Citations = 3

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11 inventors (with patents filed for the assignee):

Yonatan Hyatt (6 out of 15 patents)

Harel Boren (3 out of 5 patents)

Alexander Spivak (2 out of 3 patents)

4. Joel Koenka (1 out of 2 patents)

5. Michael Gotlieb (1 out of 1 patent)

6. Sivan Mottes (1 out of 1 patent)

7. Ran Ginsburg (1 out of 3 patents)

8. Gil Zohav (1 out of 2 patents)

9. Dagan Eshar (1 out of 2 patents)

10. Dan Carmon (1 out of 2 patents)

11. Zohar Kantor (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 11983857 - System and method for visual production line inspection of different production items (2024-05-14),

2. 11982628 - System and method for detecting defects on imaged items (2024-05-14),

3. 11816827 - User interface device for autonomous machine vision inspection (2023-11-14),

4. 11682113 - Multi-camera visual inspection appliance and method of use (2023-06-20),

5. 11574400 - System and method for automated visual inspection (2023-02-07),

6. 11562480 - System and method for set up of production line inspection (2023-01-24),

Company Overview

Inspekto is a pioneer of Autonomous Machine Vision (AMV) for the industrial sector. Its flagship product, the INSPEKTO S70, is a plug and inspect solution that puts the power of quality assurance back in the hands of production workers. With a mission to democratize vision systems, Inspekto empowers manufacturers to achieve autonomous quality assurance with minimal setup and maintenance.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

6 Patents

#37 in Ramat Gan

#1,039 in Israel

Ramat Gan, Israel

Inspekto A.m.v. Ltd.

Forward Citations = 3

11 inventors:

Yonatan Hyatt (6 out of 15 patents)

Harel Boren (3 out of 5 patents)

Alexander Spivak (2 out of 3 patents)

4. Joel Koenka (1 out of 2 patents)

5. Michael Gotlieb (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Inspekto A.m.v. Ltd.. Retrieved from https://idiyas.com/company/inspekto-a-m-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]