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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11816827 B1

PDFFull Text
Date of Patent:
Nov. 14, 2023

Filed:

Feb. 14, 2021

User interface device for autonomous machine vision inspection

Applicant:

Inspekto A.m.v. Ltd., Ramat Gan, IL;

Inventors:

Alexander Spivak, Hadera, IL;

Yonatan Hyatt, Tel-Aviv, IL;

Sivan Mottes, Pardes Hana Karkur, IL;

Assignee:

INSPEKTO A.M.V. LTD., Ramat Gan, IL;

Attorneys:

ALPHAPATENT ASSOCIATES, LTD

Daniel J. Swirsky

Primary Examiner:

Sheela C Chawan

Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06T 7/00 (2017.01); G01N 21/88 (2006.01); G06F 3/04817 (2022.01); G06F 3/04845 (2022.01); G06F 3/04847 (2022.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 21/8851 (2013.01); G06F 3/04817 (2013.01); G06F 3/04845 (2013.01); G06F 3/04847 (2013.01); G06T 7/60 (2013.01); G06T 11/00 (2013.01); G01N 2021/8887 (2013.01); G06F 2203/04806 (2013.01); G06T 2200/24 (2013.01);
Abstract

A system for visual inspection, which includes a processor that receives a sensitivity level relating to an image of an item on an inspection line, the image being displayed on the user interface device, and calculates a minimal defect size visible in the image at the received sensitivity level. The calculated minimal defect size is then displayed on a user interface. This visual demonstration of minimal detectable size, which changes as the user changes sensitivity level, enables the user to easily obtain a desired minimal detectable defect size.

Find Patent Forward Citations

Spivak, Alexander. (2023). User interface device for autonomous machine vision inspection (U.S. Patent No. 11816827). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11816827

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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