Raanana, Israel

Michael Gotlieb

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Inspekto A.m.v. Ltd.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Gotlieb. Retrieved from https://idiyas.com/inventor/michael-gotlieb-rkhkyzpu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Michael Gotlieb: Innovator in Visual Inspection Technology

Introduction

Michael Gotlieb is a prominent inventor based in Raanana, Israel. He has made significant contributions to the field of automated visual inspection technology. His innovative approach has led to the development of a unique appliance that enhances the efficiency of visual inspections.

Latest Patents

Michael Gotlieb holds a patent for a "Multi-camera visual inspection appliance and method of use." This appliance is designed for the concurrent automated visual inspection of at least two items. It comprises at least two inspection assemblies, each equipped with a camera assembly. Each item is inspected by one of the inspection assemblies, and a controller in data communication with these assemblies allows for automatic configuration for inspections.

Career Highlights

Michael is currently associated with Inspekto A.M.V. Ltd., where he applies his expertise in developing advanced inspection technologies. His work focuses on improving the accuracy and efficiency of visual inspections in various industries.

Collaborations

Michael collaborates with talented individuals such as Yonatan Hyatt and Harel Boren. Together, they work on innovative projects that push the boundaries of visual inspection technology.

Conclusion

Michael Gotlieb's contributions to the field of visual inspection technology are noteworthy. His innovative patent and collaboration with skilled professionals highlight his commitment to advancing this important area of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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