San Leandro, CA, United States of America

Humphrey Instruments Incorporated

Calculating rank
USPTO Granted Patents = 34

Trademarks = 1

Forward Citations = 519

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10 inventors (with patents filed for the assignee):

goldMedal William E Humphrey (28 out of 32 patents)

silverMedal Charles E Campbell (5 out of 42 patents)

bronzeMedal Donald E Lehmer (3 out of 8 patents)

4.  Alan L Shinn (2 out of 3 patents)

5.  F Stuart Foster (1 out of 15 patents)

6.  Alan R Kirschbaum (1 out of 6 patents)

7.  Vincent M Patella (1 out of 1 patent)

8.  Daniel H Turnbull (1 out of 1 patent)

9.  Geoff R Lockwood (1 out of 1 patent)

10.  James E Sheedy (1 out of 3 patents)


Core Competencies:
Gaze Tracking
Lensometer
Keratometer
Optical Calibration
Corneal Analysis
Field Tester
High Frequency Transducer
Wide Angle Lens
Reflection Rejection
Automated Readout
Astigmatic Testing
Light Pen

34 patents:

Company Overview
Humphrey Instruments Incorporated, based in San Leandro, CA, specializes in the design and manufacture of precision instruments and components for various industrial applications. The company focuses on delivering innovative solutions in fluid control and measurement technologies, catering to sectors such as aerospace, automotive, and medical devices. With a commitment to quality and performance, Humphrey Instruments plays a vital role in enhancing operational efficiency and reliability across diverse engineering domains.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

34 Patents

#3 in San Leandro, CA

#2,381 in California

#10,028 in US

#19,664 in the World

San Leandro, CA (US)
San Leandro, CA, United States of America
Forward Citations = 519

10 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Humphrey Instruments Incorporated. Retrieved from https://idiyas.com/company/humphrey-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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