The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 1996
Filed:
Dec. 22, 1993
Donald E Lehmer, Berkeley, CA (US);
Alan R Kirschbaum, Oakland, CA (US);
Humphrey Instruments, Inc., San Leandro, CA (US);
Abstract
A field test apparatus and method is disclosed in which gradual movement of the head supporting chin cup is used to maintain a centered relation between the eye being tested and the trial lens frame holding the required prescription for optimum vision of the patient. During the test, alternating illumination is provided in the infrared between a central corneal reflection and an iris illuminating source which imparts a high contrast bright circular iris image surrounding a central dark pupil. Content addressable memories are used to delineate areas of contrast change for rapid and abbreviated microprocessor analysis of conventional RAM images. Both the corneal reflection image--which is a brightly illuminated spot on an otherwise dark background--and the pupillary image--which is a dark pupil surrounded by a brightly illuminated high contrast image of the iris are approximately located at their boundaries using content addressable memory. Thereafter, conventionally stored video data is processed at locations restricted to the high contrast boundaries. For location of the pupil center, special techniques are disclosed for examining the image's first and second derivatives to establish the pupil center within sub-pixel limits. These methods include sufficient data processing speed improvements to enable a time shared use of a microprocessor having gaze angle measurement as a peripheral event to instrument control, and data collection required in such field testing.