The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1994
Filed:
Jul. 17, 1992
William E Humphrey, Castro Valley, CA (US);
Charles E Campbell, Berkeley, CA (US);
James E Sheedy, Oakland, CA (US);
Humphrey Instruments, Inc., San Leandro, CA (US);
Abstract
A computer indicated lens movement direction protocol is utilized in combination with a lensmeter to designate required movement of lenses with respect to a lensmeter to insure sequential measurement of progressive addition lenses. Lens measurement occurs at four sample points closely spaced on the lens surface. The system uses power variations (PV.sub.1 and PV.sub.2) at each of the spaced apart lens sampling points to indicate when sampling of the lens occurs in a region of constant spherical power, when sampling of the lens occurs in a region of changing spherical power, and finally when sampling again occurs in a region of constant and increased spherical power. When sampling of the lens occurs in a region of changing power, lens movement is guided along a path of constantly changing sphere utilizing changes in astigmatism measured in the 45.degree.-135.degree. directions (C.sub.X). A lens examination protocol is set forth with vector indicators setting forth the vertical direction required for movement as well as both desired left and right movement to maintain the shortest possible path between the respective lens portions.