% Expired Patents = 12.5

CIPO Patents = 2

EPO Patents = 1

Trademarks = 1

Forward Citations = 86

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6 inventors (with patents filed for the assignee):

Michael Rudolf (3 out of 5 patents)

Hubert Keller (2 out of 2 patents)

Yan Arnold (2 out of 2 patents)

4. Raimund Volk (1 out of 4 patents)

5. Jörg Seewig (1 out of 2 patents)

6. Heinz Wegmann (1 out of 5 patents)

8 patents: Sort by Forward Citations

1. 9395310 - Device for imaging the inner surface of a cavity in a workpiece (2016-07-19),

2. 9393663 - Measuring device (2016-07-19),

3. 8973280 - Method for determining a twist structure (2015-03-10),

4. 8725446 - Method for determining the shape of a workpiece (2014-05-13),

5. 8508743 - Crankshaft testing method (2013-08-13),

6. 8429829 - Measuring device (2013-04-30),

7. 8336224 - Measuring device (2012-12-25),

8. 8334971 - Apparatus for imaging the inner surface of a cavity within a workpiece (2012-12-18),

Company Overview

Hommel-etamic, part of the Jenoptik Group, is a leading manufacturer of metrology solutions for the automotive, aerospace, and other industries. With a focus on precision measurement technology, Hommel-etamic offers a wide range of products including surface measurement systems, form and geometry measurement devices, and laser-based optical systems. Their innovative solutions help customers optimize their manufacturing processes and ensure the highest quality standards.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

8 Patents

#8 in Villingen-Schwenningen

#4,421 in Germany

Villingen-Schwenningen, Germany

Hommel-Etamic Gmbh

Forward Citations = 86

6 inventors:

Michael Rudolf (3 out of 5 patents)

Hubert Keller (2 out of 2 patents)

Yan Arnold (2 out of 2 patents)

4. Raimund Volk (1 out of 4 patents)

5. Jörg Seewig (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hommel-Etamic Gmbh. Retrieved from https://idiyas.com/company/hommel-etamic

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]