The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Apr. 28, 2011
Jörg Seewig, Kaiserslautern, DE;
Jörg Seewig, Kaiserslautern, DE;
HOMMEL-ETAMIC GmbH, Villingen-Schwenningen, DE;
Abstract
Method for determining a twist structure in the surface roughness of a workpiece which is cylindrical at least in part includes that multiple sampling segments which extend in the axial direction of the workpiece and which are mutually spaced apart in the circumferential direction are carried out in a surface region of interest on the workpiece, and the value of at least one parameter of the twist structure is determined based on the measured values obtained using the sampling segments. An estimated value of at least one parameter of the twist structure is determined based on the measured values associated with a first sampling segment, the estimated value being corrected based on the measured values associated with at least one second sampling segment.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile