The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Sep. 20, 2010
Applicant:

Yan Arnold, Marin, CH;

Inventor:

Yan Arnold, Marin, CH;

Assignee:

Hommel-Etamic GmbH, Villingen-Schwenningen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/00 (2006.01); G01B 3/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

Measuring device for in-process measurement of test specimens during a machining process on a machine tool, in particular a grinding machine, has a measuring head connected pivotably about a first pivot axis to a base body of the measuring device via a linkage, for providing an apparatus for pivoting measuring head in and out of a measuring position. Linkage has a first linkage element and a second linkage element arranged pivotably about first pivot axis. A third linkage element is connected pivotably about a second pivot axis to the end of second linkage element facing away from first pivot axis. A fourth linkage element is connected pivotably about a third pivot axis to the end of third linkage element facing away from second pivot axis, fourth linkage element being connected pivotably about a fourth pivot axis to first linkage element at a distance from third pivot axis.


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