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Hioki E.e. Corporation

USPTO Granted Patents = 33

EPO Patents = 7

Trademarks = 7

Forward Citations = 74

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57 inventors (with patents filed for the assignee):

Toshio Heishi (8 out of 8 patents)

Koki Nakazawa (4 out of 4 patents)

Seiji Onuma (4 out of 10 patents)

4. Yutaka Ashida (3 out of 3 patents)

5. Koichi Tanaka (3 out of 21 patents)

6. Kenta Ikeda (3 out of 3 patents)

7. Naoto Nakayama (3 out of 3 patents)

8. Akihiro Shioiri (3 out of 3 patents)

9. Yuki Kawamuro (3 out of 3 patents)

10. Manabu Senda (3 out of 4 patents)

11. Manabu Yamanouchi (3 out of 3 patents)

12. Hideki Tomiyama (3 out of 3 patents)

13. Atsushi Nomura (2 out of 2 patents)

14. Shunsuke Suzuki (2 out of 2 patents)

15. Hiroyoshi Ikeda (2 out of 2 patents)

33 patents: Sort by Forward Citations

1. 12487293 - Short circuit detection device and short circuit detection method (2025-12-02),

2. 12392805 - Current measurement component, current measurement device, and current measurement method (2025-08-19),

3. 12326464 - Amplifier circuit and measurement apparatus (2025-06-10),

4. 12113861 - Measurement system, terminal, measurement instrument, and storage medium (2024-10-08),

5. 12066505 - Testing instrument and test method (2024-08-20),

6. 12062483 - Current sensor (2024-08-13),

7. 12000862 - Probe apparatus (2024-06-04),

8. 11988717 - Measurement apparatus of power storage device and measurement method (2024-05-21),

9. 11852575 - State determination apparatus, state determination method, and storage medium (2023-12-26),

10. 11796604 - Measuring apparatus and testing apparatus (2023-10-24),

11. 11796439 - Uniformity output device, uniformity output method, and non-transitory computer-readable recording medium for determining whether a particle diameter of particles in a mixture is uniform or non-uniform (2023-10-24),

12. 11754597 - Clamp sensor with a pair of clamp arms and electrical parameter measuring device (2023-09-12),

13. 11719663 - Measuring apparatus (2023-08-08),

14. 11639950 - Current sensor (2023-05-02),

15. 11525794 - Uniformity property acquisition apparatus, method of acquiring uniformity property and non-transitory computer-readable recording medium (2022-12-13),

Hioki E.E. Corporation is a leading supplier of test and measurement equipment. With a wide range of products and solutions, the company serves diverse industries including electrical, electronics, automotive, and energy. Hioki's reliable and innovative instruments are relied upon by professionals worldwide for accurate measurements, quality assurance, and troubleshooting. Their commitment to excellence and customer satisfaction has made them a trusted partner in the field of test and measurement.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

33 Patents

#1 in Ueda

#2,147 in Japan

#19,508 in the World

Hioki E.e. Corporation

Forward Citations = 74

57 inventors:

Toshio Heishi (8 out of 8 patents)

Koki Nakazawa (4 out of 4 patents)

Seiji Onuma (4 out of 10 patents)

4. Yutaka Ashida (3 out of 3 patents)

5. Koichi Tanaka (3 out of 21 patents)

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