The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Nov. 24, 2021
Applicant:

Hioki E.e. Corporation, Ueda, JP;

Inventor:

Tetsuya Nakamura, Ueda, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 67/12 (2022.01); H04L 67/1095 (2022.01);
U.S. Cl.
CPC ...
H04L 67/12 (2013.01); H04L 67/1095 (2013.01);
Abstract

Provided is a measurement system in which a measurement instrument and a terminal are configured so as to be communicatable. The measurement instrument is provided with: a measurement unit configured to execute measurement processing for measuring a physical quantity of a measurement target; a detection unit configured to detect execution of the measurement processing; and a transmission permission unit configured to permit transmission of a measurement result to the terminal, the permission being triggered by detection of the execution of the measurement processing by the detection unit. The terminal is provided with: a result reception unit configured to receive the measurement result from the measurement instrument; and an execution unit configured to execute a predetermined processing based on the measurement result received.


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