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Austin, TX, United States of America

Fractilia, LLC

USPTO Granted Patents = 19

EPO Patents = 1

Forward Citations = 124

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2 inventors (with patents filed for the assignee):

Chris Mack (19 out of 36 patents)

Jonathan Yannuzzi (1 patent)

19 patents: Sort by Forward Citations

1. 12665160 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2026-06-23),

2. 11670480 - System and method for generating and analyzing roughness measurements (2023-06-06),

3. 11664188 - Edge detection system (2023-05-30),

4. 11521825 - System and method for predicting stochastic-aware process window and yield and their use for process monitoring and control (2022-12-06),

5. 11508546 - System and method for low-noise edge detection and its use for process monitoring and control (2022-11-22),

6. 11380516 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2022-07-05),

7. 11361937 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2022-06-14),

8. 11355306 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2022-06-07),

9. 11004654 - System and method for generating and analyzing roughness measurements (2021-05-11),

10. 11004653 - Edge detection system (2021-05-11),

11. 10665418 - System and method for generating and analyzing roughness measurements (2020-05-26),

12. 10665417 - System and method for generating and analyzing roughness measurements (2020-05-26),

13. 10664955 - Edge detection system and its use for machine learning (2020-05-26),

14. 10656532 - Edge detection system and its use for optical proximity correction (2020-05-19),

15. 10648801 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2020-05-12),

Fractilia, LLC is a cutting-edge technology company specializing in the development of advanced metrology solutions for the semiconductor industry. With years of experience, our team of experts focuses on providing accurate and reliable measurements for various semiconductor parameters, helping companies ensure high-quality production. Through our innovative platform and state-of-the-art software algorithms, we enable semiconductor manufacturers to optimize their processes, reduce production costs, and improve overall product performance. Visit our website to learn more about our advanced metrology solutions.

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Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

19 Patents

#168 in Austin, TX

#1,029 in Texas

#17,095 in US

#32,551 in the World

Austin, TX, United States of America

Fractilia, LLC

Forward Citations = 124

2 inventors:

Chris Mack (19 out of 36 patents)

Jonathan Yannuzzi (1 patent)

Please report any incorrect information to [email protected]

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