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Austin, TX, United States of America

Fractilia, LLC

USPTO Granted Patents = 18

Forward Citations = 120

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1 inventor (with patents filed for the assignee):

Chris Mack (18 out of 35 patents)

18 patents: Sort by Forward Citations

1. 11670480 - System and method for generating and analyzing roughness measurements (2023-06-06),

2. 11664188 - Edge detection system (2023-05-30),

3. 11521825 - System and method for predicting stochastic-aware process window and yield and their use for process monitoring and control (2022-12-06),

4. 11508546 - System and method for low-noise edge detection and its use for process monitoring and control (2022-11-22),

5. 11380516 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2022-07-05),

6. 11361937 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2022-06-14),

7. 11355306 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2022-06-07),

8. 11004654 - System and method for generating and analyzing roughness measurements (2021-05-11),

9. 11004653 - Edge detection system (2021-05-11),

10. 10665418 - System and method for generating and analyzing roughness measurements (2020-05-26),

11. 10665417 - System and method for generating and analyzing roughness measurements (2020-05-26),

12. 10664955 - Edge detection system and its use for machine learning (2020-05-26),

13. 10656532 - Edge detection system and its use for optical proximity correction (2020-05-19),

14. 10648801 - System and method for generating and analyzing roughness measurements and their use for process monitoring and control (2020-05-12),

15. 10522322 - System and method for generating and analyzing roughness measurements (2019-12-31),

Fractilia, LLC is a cutting-edge technology company specializing in the development of advanced metrology solutions for the semiconductor industry. With years of experience, our team of experts focuses on providing accurate and reliable measurements for various semiconductor parameters, helping companies ensure high-quality production. Through our innovative platform and state-of-the-art software algorithms, we enable semiconductor manufacturers to optimize their processes, reduce production costs, and improve overall product performance. Visit our website to learn more about our advanced metrology solutions.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Jan 13 2026

18 Patents

#174 in Austin, TX

#1,078 in Texas

#17,437 in US

#33,240 in the World

Austin, TX, United States of America

Fractilia, LLC

Forward Citations = 120

1 inventor:

Chris Mack (18 out of 35 patents)

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