For the Inventor, By the Inventor

Enter assignee name

Beaverton, OR, United States of America

Formfactor Beaverton, Inc.

USPTO Granted Patents = 17

EPO Patents = 1

Trademarks = 14

Forward Citations = 22

Loading Chart...

Loading Chart...

39 inventors (with patents filed for the assignee):

Kazuki Negishi (7 out of 18 patents)

Joseph George Frankel (3 out of 12 patents)

Michael E Simmons (3 out of 15 patents)

4. Christopher Anthony Storm (2 out of 5 patents)

5. Gavin Neil Fisher (2 out of 5 patents)

6. Koby L Duckworth (2 out of 8 patents)

7. Bryan Conrad Bolt (2 out of 10 patents)

8. Daniel Mark Bock (2 out of 2 patents)

9. Timothy Allen McMullen (2 out of 2 patents)

10. Michael Teich (2 out of 19 patents)

11. Sia Choon Beng (1 out of 8 patents)

12. Roy Swart (1 out of 9 patents)

13. Eric Robert Christenson (1 out of 8 patents)

14. Thomas Reiner Thaerigen (1 out of 2 patents)

15. Peter McCann (1 out of 13 patents)

17 patents: Sort by Forward Citations

1. 10877070 - Probes with fiducial targets, probe systems including the same, and associated methods (2020-12-29),

2. 10809048 - Probe systems and methods for calibrating capacitive height sensing measurements (2020-10-20),

3. 10698025 - Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test (2020-06-30),

4. 10698002 - Probe systems for testing a device under test (2020-06-30),

5. 10571487 - Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test (2020-02-25),

6. 10459006 - Probe systems and methods (2019-10-29),

7. 10365323 - Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change (2019-07-30),

8. 10330703 - Probe systems and methods including electric contact detection (2019-06-25),

9. 10281518 - Systems and methods for on-wafer dynamic testing of electronic devices (2019-05-07),

10. 10281492 - Shielded probe systems with controlled testing environments (2019-05-07),

11. 10267848 - Method of electrically contacting a bond pad of a device under test with a probe (2019-04-23),

12. 10180486 - Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods (2019-01-15),

13. 10161994 - Systems and methods for electrically testing electromigration in an electromigration test structure (2018-12-25),

14. 10120020 - Probe head assemblies and probe systems for testing integrated circuit devices (2018-11-06),

15. 10062597 - High voltage chuck for a probe station (2018-08-28),

FormFactor Beaverton, Inc. is a leading provider of testing and measurement solutions for advanced semiconductor packaging. With over 20 years of industry experience, we offer innovative probe cards, analytical probes, and fully-integrated test systems to enable customers to maximize their yield and reduce overall cost of test. Our state-of-the-art technologies and engineering expertise make us a trusted partner for semiconductor manufacturers worldwide.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

17 Patents

#20 in Beaverton, OR

#181 in Oregon

#18,311 in US

#34,859 in the World

Beaverton, OR, United States of America

Formfactor Beaverton, Inc.

Forward Citations = 22

39 inventors:

Kazuki Negishi (7 out of 18 patents)

Joseph George Frankel (3 out of 12 patents)

Michael E Simmons (3 out of 15 patents)

4. Christopher Anthony Storm (2 out of 5 patents)

5. Gavin Neil Fisher (2 out of 5 patents)

Please report any incorrect information to support@idiyas.com

Loading…