Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
9 Patents
#67 in Auburn Hills, MI
#1,117 in Michigan
#32,588 in US
Fev North America Incorporated
Forward Citations = 48
24 inventors:
Auburn Hills, MI, United States of America
Fev North America Incorporated
% Expired Patents = 33.3
Trademarks = 1
Forward Citations = 48
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24 inventors (with patents filed for the assignee):
Mufaddel Z Dahodwala (3 out of 6 patents)
Erik Koehler (3 out of 7 patents)
Tamas Szailer (3 out of 10 patents)
4. Dean Tomazic (3 out of 8 patents)
5. Satyum Joshi (2 out of 5 patents)
6. Michael Franke (2 out of 5 patents)
7. Harsha Nanjundaswamy (2 out of 3 patents)
8. Joel Deussen (2 out of 2 patents)
9. Gregory McConville (1 out of 69 patents)
10. Liangjun Hu (1 out of 22 patents)
11. Patrick Haenel (1 out of 2 patents)
12. Soumendu Chanda (1 out of 1 patent)
13. Martin Pischinger (1 out of 2 patents)
14. Stephan A Tarnutzer (1 out of 8 patents)
15. Brian A Fischer (1 out of 1 patent)
9 patents:
Company Overview
Fev North America Incorporated is a leading engineering and development company that specializes in innovative solutions for the automotive industry. With a focus on performance, efficiency, and sustainability, Fev NA offers a wide range of services including design, testing, and calibration. Their commitment to excellence and cutting-edge technology has made them a trusted partner for automotive manufacturers worldwide.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Fev North America Incorporated. Retrieved from https://idiyas.com/company/fev-north-america
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]