Syosset, NY, United States of America

Fairchild Weston Systems, Inc.


USPTO Granted Patents = 15


Forward Citations = 361

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15 inventors (with patents filed for the assignee):

goldMedal William N Waggener, Jr (3 out of 17 patents)

silverMedal Ralph H Wight (2 out of 6 patents)

bronzeMedal Harvey L Balopole (2 out of 3 patents)

4.  David G Hart (2 out of 2 patents)

5.  Joseph M Daszkowski (2 out of 2 patents)

6.  Jae S Kim (1 out of 6 patents)

7.  Joseph F Kishel (1 out of 3 patents)

8.  Thomas H Traynor (1 out of 1 patent)

9.  Stephen J Outhwaite (1 out of 1 patent)

10.  William R Davis (1 out of 1 patent)

11.  James P Thornton (1 out of 1 patent)

12.  Henry W Sadowski (1 out of 1 patent)

13.  Arthur Roberts (1 out of 1 patent)

14.  James J Martinolich (1 out of 1 patent)

15.  John P Keal (1 out of 1 patent)


15 patents:

Company Overview
Fairchild Weston Systems, Inc. is a prominent player in the field of advanced electronic systems, specializing in the development and manufacturing of high-performance sensors and measurement devices. The company focuses on delivering innovative solutions for various industries, including aerospace, defense, and industrial applications. With a commitment to precision and reliability, Fairchild Weston leverages cutting-edge technology to enhance operational efficiency and safety in complex environments, primarily serving clients across the United States and beyond.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

15 Patents

#4 in Syosset, NY

#1,219 in New York

#21,052 in US

#39,921 in the World

Syosset, NY (US)
Syosset, NY, United States of America
Forward Citations = 361

15 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Fairchild Weston Systems, Inc.. Retrieved from https://idiyas.com/company/fairchild-weston-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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