Clarks Summit, PA, United States of America

Stephen J Outhwaite

This inventor holds 1 USPTO granted patent. Top assignee: Fairchild Weston Systems, Inc.. Active years: 1984.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephen J Outhwaite. Retrieved from https://idiyas.com/inventor/stephen-j-outhwaite

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1984

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Stephen J Outhwaite

Introduction

Stephen J Outhwaite is a notable inventor based in Clarks Summit, Pennsylvania. He has made significant contributions to the field of radiation measurement technology. His work primarily focuses on enhancing the accuracy and efficiency of scintillation crystals used in various applications.

Latest Patents

Outhwaite holds a patent for a "Method for calibrating scintillation crystal." This invention involves a unique approach to calibrating X-ray or gamma-ray scintillation crystals utilized in radiation-type thickness gauges. The method includes irradiating the scintillation crystal at a high intensity and then abruptly lowering the intensity to a low level. The nonlinear response of the crystal, due to after-glow and hysteresis, is periodically measured and correlated with an ideal response function. This innovative calibration technique allows for accurate measurements without waiting for the afterglow to dissipate.

Career Highlights

Stephen J Outhwaite is associated with Fairchild Weston Systems, Inc., where he applies his expertise in developing advanced measurement technologies. His career reflects a commitment to innovation and improvement in the field of radiation measurement.

Collaborations

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Conclusion

Stephen J Outhwaite's contributions to the field of scintillation crystal calibration demonstrate his innovative spirit and dedication to advancing technology. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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