Dynatek Labs, Inc.

Calculating rank

USPTO Granted Patents = 5

Forward Citations = 5

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8 inventors (with patents filed for the assignee):

Christopher Conti (4 out of 4 patents)

James C Conti (4 out of 10 patents)

Elaine R Strope (4 out of 6 patents)

4. Donald John Rohde (1 out of 1 patent)

5. Mark Alan Schultz (1 out of 62 patents)

6. Alicia Sullivan (1 out of 1 patent)

7. Kendra Conti (1 out of 1 patent)

8. Donald Rohde (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 12582523 - Durability and particulate testing system and method (2026-03-24),

2. 11087453 - Automated failure detection for medical device testing systems and methods (2021-08-10),

3. 10627315 - Fatigue to fracture medical device testing method and system (2020-04-21),

4. 10605700 - Fatigue to fracture medical device testing method and system (2020-03-31),

5. 9453788 - Acute medical particulate testing device (2016-09-27),

Company Overview

Dynatek Labs, Inc. is a leading provider of testing and validation services for the aerospace and defense industries. With state-of-the-art facilities and a team of experienced engineers, we offer a wide range of solutions to meet our clients' needs. From environmental testing to vibration analysis, our services help ensure the reliability and performance of our clients' products. Visit our website for more information.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

5 Patents

#1 in Galena, MO

#729 in Missouri

#51,708 in US

Galena, MO, United States of America

Dynatek Labs, Inc.

Forward Citations = 5

8 inventors:

Christopher Conti (4 out of 4 patents)

James C Conti (4 out of 10 patents)

Elaine R Strope (4 out of 6 patents)

4. Donald John Rohde (1 out of 1 patent)

5. Mark Alan Schultz (1 out of 62 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Dynatek Labs, Inc.. Retrieved from https://idiyas.com/company/dynatek-labs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]