The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Jun. 11, 2019
Applicant:
Dynatek Labs, Inc., Galena, MO (US);
Inventors:
Mark Alan Schultz, Billings, MO (US);
Donald John Rohde, Springfield, MO (US);
Christopher Conti, Galena, MO (US);
Assignee:
DYNATEK LABS, INC., Galena, MO (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06T 7/174 (2017.01); A61F 2/90 (2013.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); A61F 2/90 (2013.01); G06T 7/13 (2017.01); G06T 7/174 (2017.01); A61F 2240/008 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30052 (2013.01); G06T 2207/30136 (2013.01);
Abstract
Systems and methods are described for capturing images of articles under test and processing the images to automatically detect the failure of a test article. The described methods include optimizing image capture to allow for the use of low cost imaging devices instead of high speed cameras or other expensive equipment. The described methods also include several methods for processing the images to identify the occurrence of a failure event.