The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Apr. 11, 2023
Christopher Conti, Galena, MO (US);
James Conti, Galena, MO (US);
Alicia Sullivan, Galena, MO (US);
Donald Rohde, Galena, MO (US);
Kendra Conti, Galena, MO (US);
Elaine Strope, Galena, MO (US);
Christopher Conti, Galena, MO (US);
James Conti, Galena, MO (US);
Alicia Sullivan, Galena, MO (US);
Donald Rohde, Galena, MO (US);
Kendra Conti, Galena, MO (US);
Elaine Strope, Galena, MO (US);
DYNATEK LABS, INC., Galena, MO (US);
Abstract
A medical device durability and particulate testing system is provided including a durability tester component configured for continually actuating movement of structural device(s); a simulated blood fluid; fluid flow lines; a particle counter component configured for recording continuous particulate data from device(s) subjected to durability testing; flow meters; a fluid management system; and one or more system controller(s) having a processor configured with software for controlling operation of the system and recording data. In an embodiment, the system includes a user interface accessible via a display. In some embodiments the system further includes a heater paired with temperature measuring devices to maintain fluid temperatures within appropriate bounds to simulate blood within the body. In an exemplary embodiment, the durability and particulate testing system is a continuous flow, closed loop system and configured for testing synthetic structural heart devices to simulate the expected lifetime of the device(s).