Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
15 Patents
#227 in Hong Kong
#1,919 in China
#39,921 in the World
Cree Hong Kong Limited
Forward Citations = 406
18 inventors:
Cree Hong Kong Limited
Forward Citations = 406
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18 inventors (with patents filed for the assignee):
Chi-Wing Leung (5 out of 5 patents)
Wai Kwan Chan (3 out of 37 patents)
Chi Man Chris Li (2 out of 5 patents)
4. Wai To Yan (2 out of 5 patents)
5. Ho Ching Gauss So (2 out of 5 patents)
6. Chi Hoi Felix Mung (2 out of 5 patents)
7. Alex Chi Keung Chan (2 out of 6 patents)
8. Siu Cheong Cheng (2 out of 4 patents)
9. Jian Hui Xie (2 out of 6 patents)
10. Nelson Man Hoi Lui (2 out of 2 patents)
11. Chi Hoi Mung (2 out of 2 patents)
12. Yuh-Ren Shieh (2 out of 2 patents)
13. David T Emerson (1 out of 150 patents)
14. Chin Wah Ho (1 out of 9 patents)
15. Antony Paul Van De Ven (1 out of 231 patents)
15 patents:
Company Overview
Cree Hong Kong Limited is a prominent player in the development and manufacturing of advanced semiconductor solutions, particularly focusing on silicon carbide (SiC) and gallium nitride (GaN) technologies. The company specializes in high-performance power and radio frequency (RF) devices, catering to various sectors including automotive, industrial, and telecommunications. With a strong emphasis on innovation, Cree Hong Kong contributes significantly to the advancement of energy-efficient solutions and next-generation electronic applications in the Asia-Pacific region.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Cree Hong Kong Limited. Retrieved from https://idiyas.com/company/cree-hong-kong
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]