Geretsried, Germany

Byk-Gardner Gmbh


USPTO Granted Patents = 63


Trademarks = 19

Forward Citations = 407

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13 inventors (with patents filed for the assignee):

goldMedal Peter Schwarz (31 out of 31 patents)

silverMedal Uwe Sperling (20 out of 20 patents)

bronzeMedal Konrad Lex (16 out of 16 patents)

4.  Heinrich Henssler (9 out of 29 patents)

5.  Martin Schultheiss (9 out of 43 patents)

6.  Karin Patricia Anger-Marx (8 out of 9 patents)

7.  Severin Wimmer (3 out of 3 patents)

8.  Thomas J Keane (2 out of 5 patents)

9.  Todd A Jackson (1 out of 6 patents)

10.  Christopher Groh (1 out of 1 patent)

11.  Gerhard Hentschel (1 out of 1 patent)

12.  Ralf Zellner (1 out of 1 patent)

13.  James M Chwalek (1 out of 1 patent)


Core Competencies:
Spectral Photometer
Colorimeter
Surface Properties
Optical Properties
Appearance Measurement
Texture Analysis
Goniometric Examination
Calibration Instruments
Effect Pigments
Illumination Devices
Surface Quality

63 patents:

Company Overview
Byk-Gardner GmbH, based in Geretsried, Germany, specializes in optical measurement technology, focusing on the development and manufacturing of advanced instruments for quality control in various industries. Their expertise encompasses spectral photometers, colorimeters, and tools for assessing surface and optical properties, as well as appearance measurement and texture analysis. Byk-Gardner is committed to providing precise calibration instruments that enhance product quality and consistency across diverse applications.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

Byk-Gardner Gmbh USPTO Patent Assignee Logo
63 Patents

#1 in Geretsried

#889 in Germany

#11,627 in the World

Geretsried, DE
Geretsried, Germany
Forward Citations = 407

13 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Byk-Gardner Gmbh. Retrieved from https://idiyas.com/company/byk-gardner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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