The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Aug. 11, 2022
Applicant:

Byk-gardner Gmbh, Geretsried, DE;

Inventor:

Uwe Sperling, Geretsried, DE;

Assignee:

BYK-GARDNER GMBH, Geretsried, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 2201/062 (2013.01);
Abstract

An apparatus for examining surface properties of lacquered surfaces, in particular of motor vehicles, having a first illumination device which illuminates a surface to be examined at a first illumination angle, having a second illumination device which illuminates the surface at a second illumination angle, having a first sensor device which records radiation reflected and/or scattered by the surface illuminated by the second illumination device at a first recording angle and outputs at least one value which is characteristic of the radiation reaching the sensor device from the surface, wherein the apparatus has a radiation analysis device which analyses radiation scattered and/or reflected by the surface with regard to its wavelength.


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Sperling, Uwe. (2026). Apparatus and method for inspecting surfaces with wavelength analysis (U.S. Patent No. 12742728). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12742728

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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