The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Jun. 15, 2018
Byk-gardner Gmbh, Geretsried, DE;
Peter Schwarz, Königsdorf, DE;
BYK-GARDNER GMBH, Geretsried, DE;
Abstract
The invention relates to a docking stationfor a surface measuring apparatus, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surfacewhich can be brought into a covered state in which it is covered from the environment of the docking stationand an uncovered state in which it is not covered from the environment of the docking station. When the surface measuring apparatusis in the docking stationand the reference measuring surfaceis in the uncovered state, the surface measuring apparatuscan perform a reference measurement of the reference measuring surfaceand can calibrate the surface measuring apparatususing the reference measurement. In contrast, when the reference measuring surfaceis in the covered state, it is not exposed to the environment of the docking stationand is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surfaceare preferably reached through a movement of the reference measuring surfaceitself or through a movement of a cover for the reference measuring surface