Company Badge
USPTO Data Jan 1 1976 - Nov 3 2026
10 Patents
#21 in Bethlehem, PA
#1,085 in Pennsylvania
#29,922 in US
#56,169 in the World
Baker Instruments Corp.
Forward Citations = 224
10 inventors:
Bethlehem, PA, United States of America
Baker Instruments Corp.
Calculating rank
Forward Citations = 224
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10 inventors (with patents filed for the assignee):
Peter R Farina (5 out of 8 patents)
Bernard Parker (3 out of 5 patents)
James A Grattan (3 out of 4 patents)
4. James R Golke (2 out of 3 patents)
5. Jemo Kang (2 out of 2 patents)
6. Eddie Hedaya (1 out of 6 patents)
7. Brian Parsonnet (1 out of 1 patent)
8. Jeanette D Mier (1 out of 1 patent)
9. James R Gohlke (1 out of 1 patent)
10. Glen L Tolman (1 out of 5 patents)
10 patents:
Company Overview
Baker Instruments Corp., based in Bethlehem, PA, specializes in advanced measurement and testing solutions for various industries. The company focuses on developing innovative technologies that enhance the performance and reliability of electrical and electronic systems. With a commitment to quality and precision, Baker Instruments serves sectors such as aerospace, automotive, and industrial applications, providing tools that facilitate rigorous testing and analysis to ensure optimal operational efficiency.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Baker Instruments Corp.. Retrieved from https://idiyas.com/company/baker-instruments
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]