Aerometrics, Inc.

Calculating rank

USPTO Granted Patents = 6

Forward Citations = 151

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5 inventors (with patents filed for the assignee):

William D Bachalo (6 out of 19 patents)

Khalid M Ibrahim (2 out of 9 patents)

Subramanian V Sankar (1 out of 2 patents)

4. Andrew S Inenaga (1 out of 1 patent)

5. Adam Isakovic (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 5808895 - Method and apparatus for low signal to noise ratio instantaneous phase (1998-09-15),

2. 5557040 - Method and apparatus for precipitation detection and differentiation (1996-09-17),

3. 5547327 - Method and apparatus for continuously determining the inclination and (1996-08-20),

4. 5289391 - Method and apparatus for optimum signal burst detection (1994-02-22),

5. 4986659 - Method for measuring the size and velocity of spherical particles using (1991-01-22),

6. 4854705 - Method and apparatus to determine the size and velocity of particles (1989-08-08),

Company Overview

Aerometrics, Inc. is a leading provider of cutting-edge airborne remote sensing solutions for environmental monitoring, agriculture, forestry, and other industries. With advanced LiDAR and imaging technologies, we deliver high-quality data and actionable insights to our clients to help them make informed decisions. Our team of experts is dedicated to providing innovative solutions that meet the unique needs of our customers.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

6 Patents

#431 in Sunnyvale, CA

#10,583 in California

#45,027 in US

Sunnyvale, CA, United States of America

Aerometrics, Inc.

Forward Citations = 151

5 inventors:

William D Bachalo (6 out of 19 patents)

Khalid M Ibrahim (2 out of 9 patents)

Subramanian V Sankar (1 out of 2 patents)

4. Andrew S Inenaga (1 out of 1 patent)

5. Adam Isakovic (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Aerometrics, Inc.. Retrieved from https://idiyas.com/company/aerometrics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]