The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1998
Filed:
May. 31, 1996
Applicant:
Inventors:
Khalid M Ibrahim, San Jose, CA (US);
William D Bachalo, Los Altos Hills, CA (US);
Assignee:
Aerometrics, Inc., Sunnyvale, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364484 ; 364484 ; 364485 ; 324 7647 ; 324 7677 ; 324 7682 ;
Abstract
The system and method of the present invention generates high resolution phase measurements without the high processing and memory overhead requirements found in prior art circuits and methods. Each signal sample (of N samples) is divided further into J segments each segment having K samples. The frequency is computed with respect to one J segment and is used in the phase measurement computations performed for the remaining segments. The phase measurements performed with respect to each J segment are then averaged to compute a high resolution phase measurement for the corresponding N segment.