The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 1996

Filed:

Feb. 27, 1996
Applicant:
Inventors:

Andrew S Inenaga, Sacramento, CA (US);

William D Bachalo, Los Altos Hills, CA (US);

Subramanian V Sankar, Fremont, CA (US);

Assignee:

Aerometrics, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01W / ;
U.S. Cl.
CPC ...
7317021 ; 7317017 ; 25055909 ;
Abstract

A direct backscatter technique provides for the detection of precipitation in a measuring volume. A source light beam is projected into the measuring volume. Light in the volume, including source light scattered from any precipitation within the volume, is collected and detected. A signal is generated corresponding to the detected light. This signal is used to determine whether precipitation is present in the measuring volume. The light scattered from precipitation within the measuring volume may also be used to differentiate between types of particles. Rain and snow, for example, can be differentiated based on whether the transmitted light changed from its original polarization state.


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