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Singapore, Singapore

Advantest (Singapore) Pte Ltd

USPTO Granted Patents = 35

% Expired Patents = 5.7

Forward Citations = 141

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43 inventors (with patents filed for the assignee):

Jochen Rivoir (10 out of 49 patents)

Edmundo De La Puente (3 out of 22 patents)

Romi Mayder (3 out of 21 patents)

4. Erik H Volkerink (3 out of 16 patents)

5. Markus Rottacker (2 out of 7 patents)

6. Bernd Laquai (2 out of 11 patents)

7. Gerald Chan (2 out of 6 patents)

8. David Eskeldson (2 out of 12 patents)

9. Alan D Hart (2 out of 3 patents)

10. Reid F Hayhow (2 out of 16 patents)

11. Richard C Dokken (2 out of 8 patents)

12. Ajay Khoche (1 out of 133 patents)

13. Alf Clement (1 out of 4 patents)

14. John C Potter (1 out of 6 patents)

15. Martin Fischer (1 out of 39 patents)

Core Competencies:

Signal Distribution

Circuit Board Fabrication

Binary Value Determination

Testing Singulated Die

Data Processing Unit

Automated Test Equipment

Probe Card Assemblies

Electrostatic Discharge

Test Resource Sharing

Fault Detection

Yield Improvement

Data Formatting

35 patents: Sort by Forward Citations

1. 8933718 - Signal distribution structure and method for distributing a signal (2015-01-13),

2. 8925193 - Methods for fabricating circuit boards (2015-01-06),

3. 8898210 - Method and apparatus for determining a minimum/maximum of a plurality of binary values (2014-11-25),

4. 8886987 - Data processing unit and a method of processing data (2014-11-11),

5. 8884639 - Methods, apparatus and articles of manufacture for testing a plurality of singulated die (2014-11-11),

6. 8880574 - State machine and generator for generating a description of a state machine feedback function (2014-11-04),

7. 8838406 - Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment (2014-09-16),

8. 8825424 - Apparatus and method for estimating data relating to a time difference and apparatus and method for calibrating a delay line (2014-09-02),

9. 8797056 - System and method for electronic testing of partially processed devices (2014-08-05),

10. 8797046 - Method of sharing a test resource at a plurality of test sites, automated test equipment, handler for loading and unloading devices to be tested and test system (2014-08-05),

11. 8769361 - Cost estimation for device testing (2014-07-01),

12. 8745568 - Method and apparatus for determining relevance values for a detection of a fault on a chip and for determining a fault probability of a location on a chip (2014-06-03),

13. 8645775 - Method and apparatus for the determination of a repetitive bit value pattern (2014-02-04),

14. 8615691 - Process for improving design-limited yield by localizing potential faults from production test data (2013-12-24),

15. 8594957 - System, method and computer program for detecting an electrostatic discharge event (2013-11-26),

Company Overview

Advantest (Singapore) Pte Ltd is a prominent player in the semiconductor and electronic test equipment industry. The company specializes in developing advanced testing solutions that enhance the performance and reliability of electronic devices. With a focus on innovation, Advantest operates within key technology domains such as semiconductor testing, system-on-chip solutions, and automated test equipment. Its strategic location in Singapore positions it well within the vibrant Asia-Pacific technology landscape, enabling collaboration and growth in the region.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

35 Patents

#85 in Singapore

#85 in Singapore

#19,168 in the World

Singapore, Singapore

Advantest (Singapore) Pte Ltd

Forward Citations = 141

43 inventors:

Jochen Rivoir (10 out of 49 patents)

Edmundo De La Puente (3 out of 22 patents)

Romi Mayder (3 out of 21 patents)

4. Erik H Volkerink (3 out of 16 patents)

5. Markus Rottacker (2 out of 7 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advantest (Singapore) Pte Ltd. Retrieved from https://idiyas.com/company/advantest-singapore

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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