For the Inventor, By the Inventor

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Tigard, OR, United States of America

Advanced Inquiry Systems, Inc.

USPTO Granted Patents = 31

Trademarks = 1

Forward Citations = 170

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9 inventors (with patents filed for the assignee):

Morgan T Johnson (29 out of 57 patents)

Aaron Durbin (3 out of 12 patents)

David Keith (2 out of 5 patents)

4. Raymond J Werner (2 out of 5 patents)

5. Jose A Santos (1 out of 3 patents)

6. Jens Ruffler (1 out of 1 patent)

7. Lawrence H Walls (1 out of 1 patent)

8. Peter H Decher (1 out of 2 patents)

9. Kenneth S Whiteman (1 out of 3 patents)

31 patents: Sort by Forward Citations

1. 8889526 - Apparatus for thinning, testing and singulating a semiconductor wafer (2014-11-18),

2. 8872533 - Wafer testing system and associated methods of use and manufacture (2014-10-28),

3. 8779789 - Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods (2014-07-15),

4. 8704544 - Method and apparatus for multi-planar edge-extended wafer translator (2014-04-22),

5. 8697456 - Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereon (2014-04-15),

6. 8536062 - Chemical removal of oxide layer from chip pads (2013-09-17),

7. 8476630 - Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereon (2013-07-02),

8. 8461024 - Methods and apparatus for thinning, testing and singulating a semiconductor wafer (2013-06-11),

9. 8405414 - Wafer testing systems and associated methods of use and manufacture (2013-03-26),

10. 8362797 - Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebetween (2013-01-29),

11. 8076216 - Methods and apparatus for thinning, testing and singulating a semiconductor wafer (2011-12-13),

12. 7960986 - Methods and apparatus for multi-modal wafer testing (2011-06-14),

13. 7791174 - Wafer translator having a silicon core isolated from signal paths by a ground plane (2010-09-07),

14. 7786745 - Method and apparatus for single-sided extension of electrical conductors beyond the edges of a substrate (2010-08-31),

15. 7786724 - Methods and apparatus for collecting process characterization data after first failure in a group of tested devices (2010-08-31),

Advanced Inquiry Systems, Inc. is a leading technology company specializing in providing innovative solutions for data analysis and inquiry management. With a team of highly skilled professionals, our company is committed to developing cutting-edge software tools that help businesses make informed decisions and streamline their operations. Whether it's data visualization, complex data analysis algorithms, or customized inquiry management systems, our solutions are designed to enhance productivity and drive success.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

31 Patents

#3 in Tigard, OR

#115 in Oregon

#10,538 in US

#20,590 in the World

Tigard, OR, United States of America

Advanced Inquiry Systems, Inc.

Forward Citations = 170

9 inventors:

Morgan T Johnson (29 out of 57 patents)

Aaron Durbin (3 out of 12 patents)

David Keith (2 out of 5 patents)

4. Raymond J Werner (2 out of 5 patents)

5. Jose A Santos (1 out of 3 patents)

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