The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Aug. 18, 2017
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Ching-Feng Fu, Taichung, TW;
De-Fang Chen, Hsinchu, TW;
Yu-Chan Yen, Taipei, TW;
Chia-Ying Lee, New Taipei, TW;
Chun-Hung Lee, Hsinchu, TW;
Huan-Just Lin, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Abstract
A method includes depositing a sacrificial layer on a first dielectric layer over a substrate; applying a first patterning process, a second patterning process, a third patterning process to the sacrificial layer to form a first group of openings, a second group of openings and a third group of openings, respectively, in the sacrificial layer, wherein three first openings from three different patterning processes form a first side, a second side and a first angle between the first side and the second side, and three second openings from the three different patterning processes form a third side, a fourth side and a second angle between the third side and the fourth side, wherein the first angle is approximately equal to the second angle and forming nanowires based on the first group of openings, the second group of openings and the third group of openings.