The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Feb. 16, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Yuan-Yen Lo, Hsin-Chu, TW;

Jhih-Yu Wang, New Taipei, TW;

Jhun Hua Chen, Changhua County, TW;

Hung-Chang Hsieh, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 21/8234 (2006.01); H01L 21/308 (2006.01); H01L 29/66 (2006.01); H01L 21/306 (2006.01); H01L 27/088 (2006.01); H01L 23/535 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823475 (2013.01); H01L 21/3085 (2013.01); H01L 21/30604 (2013.01); H01L 21/76895 (2013.01); H01L 21/823468 (2013.01); H01L 21/823481 (2013.01); H01L 23/535 (2013.01); H01L 27/088 (2013.01); H01L 29/66545 (2013.01); H01L 29/66553 (2013.01);
Abstract

A method includes depositing an ESL on a substrate; patterning the ESL such that a first region of the substrate is covered thereby and a second region of the substrate is exposed within an opening of the etch stop layer; depositing a first dielectric layer on the ESL in the first region and on the substrate in the second region; patterning the first dielectric layer to form a first trench through the first dielectric layer in the first region; forming a metal feature in the first trench; depositing a second dielectric layer over the metal feature in the first region and over the first dielectric layer in the second region; and performing a patterning process to form a second trench through the second dielectric layer in the first region, and to form a third trench through the second and first dielectric layers in the second region.


Find Patent Forward Citations

Loading…