The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Oct. 31, 2016
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Tang-Jung Chiu, Hsinchu, TW;

Mill-Jer Wang, Hsinchu, TW;

Hung-Chih Lin, Hsinchu, TW;

Hao Chen, New Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 23/66 (2006.01); H01L 23/525 (2006.01); G01R 1/073 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H01L 22/22 (2013.01); G01R 1/06772 (2013.01); G01R 1/07342 (2013.01); G01R 31/2886 (2013.01); H01L 22/34 (2013.01); H01L 23/5256 (2013.01); H01L 23/66 (2013.01); H01L 2223/6672 (2013.01);
Abstract

A semiconductor device is disclosed. The semiconductor device includes: a System on Chip (SoC) die; an integrated passive device (IPD); and a first switch, coupled between the SoC die and the IPD; wherein the IPD and the SoC die are disposed in different wafers and bonded together, and the first switch is controlled to disconnect the IPD from the SoC die when the IPD is under a test; and the first switch is controlled to connect the IPD with the SoC die when the IPD is not under the test. A test system for testing an IPD of a semiconductor device and an associated method are also disclosed.


Find Patent Forward Citations

Chiu, Tang-Jung. (2018). Semiconductor device, test system and method of the same (U.S. Patent No. 9859176). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9859176

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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