The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Nov. 14, 2013
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Shih-Wei Bih, Taichung, TW;

Wei-Jen Chen, Taichung, TW;

Yen-Yu Chen, Taichung, TW;

Hsien-Chieh Hsiao, Taichung, TW;

Chang-Sheng Lee, Shin-Chu, TW;

Wei-Chen Liao, Nantou County, TW;

Wei Zhang, Chupei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/35 (2006.01); C23C 14/34 (2006.01); H01J 37/34 (2006.01); H01J 37/32 (2006.01); C23C 14/56 (2006.01);
U.S. Cl.
CPC ...
C23C 14/34 (2013.01); C23C 14/564 (2013.01); H01J 37/32467 (2013.01); H01J 37/32477 (2013.01); H01J 37/34 (2013.01); H01J 37/3411 (2013.01); H01J 37/3426 (2013.01); H01J 37/3447 (2013.01);
Abstract

A physical vapor deposition (PVD) chamber, a process kit of a PVD chamber and a method of fabricating a process kit of a PVD chamber are provided. In various embodiments, the PVD chamber includes a sputtering target, a power supply, a process kit, and a substrate support. The sputtering target has a sputtering surface that is in contact with a process region. The power supply is electrically connected to the sputtering target. The process kit has an inner surface at least partially enclosing the process region, and a liner layer disposed on the inner surface. The substrate support has a substrate receiving surface, wherein the liner layer disposed on the inner surface of the process kit has a surface roughness (Rz), and the surface roughness (Rz) is substantially in a range of 50-200 μm.


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