The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Jan. 13, 2014
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Tsung-Min Huang, Taichung, TW;

Chung-Ju Lee, Hsinchu, TW;

Chih-Tsung Shih, Hsinchu, TW;

Yen-Cheng Lu, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/47 (2006.01); H01L 21/76 (2006.01); H01L 21/30 (2006.01); H01L 21/46 (2006.01); H01L 21/768 (2006.01); G03F 7/00 (2006.01); G03F 7/09 (2006.01); H01L 21/027 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76811 (2013.01); G03F 7/0035 (2013.01); G03F 7/094 (2013.01); H01L 21/0274 (2013.01); H01L 21/31144 (2013.01); H01L 21/76808 (2013.01); H01L 21/76813 (2013.01);
Abstract

The present disclosure provides a method for forming an integrated circuit (IC) structure. The method comprises providing a semiconductor structure including a substrate, a dielectric layer formed over the substrate, and a hard mask region formed over the dielectric layer; forming a first photoresist layer over the hard mask region; performing a first lithography exposure using a photomask to form a first latent pattern; forming a second photoresist layer over the hard mask region; and performing a second lithography exposure using the photomask to form a second latent pattern. The photomask includes a first mask feature and a second mask feature. The first latent pattern corresponds to the first mask feature, and the second latent pattern corresponds to the first mask feature and the second mask feature.


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