The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Dec. 22, 2016
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Wen-Chuan Wang, Hsinchu, TW;

Burn Jeng Lin, Hsinchu, TW;

Jaw-Jung Shin, Hsinchu, TW;

Pei-Yi Liu, Changhua, TW;

Shy-Jay Lin, Jhudong Township, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70058 (2013.01); G03F 7/20 (2013.01); G03F 7/2051 (2013.01); G03F 7/2059 (2013.01); G03F 7/70291 (2013.01); G03F 7/70625 (2013.01); G06F 17/5068 (2013.01); G06F 17/5072 (2013.01); G06F 17/5081 (2013.01);
Abstract

Lithography methods disclosed herein accommodate shrinking pattern dimensions. An exemplary method includes receiving a pattern to be transferred to a workpiece by a pattern generator. The pattern generator is divided into a first segment set and a second segment set based on the pattern, such that a collective exposure dose from the first segment set and the second segment set satisfies an exposure dose specified by the pattern. The first segment set is offset from the second segment set in a first direction, and segments in the first segment set and segments in the second segment set are offset from each other in a second direction different than the first direction. The method further includes exposing the workpiece according to the first segment set and the second segment set.


Find Patent Forward Citations

Loading…