The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Aug. 09, 2014
Pattern critical dimension measurement equipment and method for measuring pattern critical dimension
Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;
Kaori Shirahata, Tokyo, JP;
Yasunari Sohda, Tokyo, JP;
Makoto Sakakibara, Tokyo, JP;
Daisuke Bizen, Tokyo, JP;
Hajime Kawano, Tokyo, JP;
Hideyuki Kazumi, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
Pattern critical dimension measurement equipment includes an electron source configured to generate a primary electron beam, a deflector configured to deflect the primary electron beam emitted from the electron source, a focusing lens configured to focus the primary electron beam deflected by the deflector, a decelerator configured to decelerate the primary electron beam that irradiates the sample, a first detector located between the electron source and the focusing lens, the first detector being configured to detect electrons at part of azimuths of electrons generated from the sample upon irradiation of the sample with the primary electron beam, and a second detector located between the electron source and the first detector, the second detector being configured to detect electrons at substantially all azimuths of the electrons generated from the sample.