The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9506868 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 29, 2016

Filed:

Sep. 27, 2013
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Universite D'orleans, Orleans, FR;

Compagnie Industrielle Des Lasers Cilas, Orleans, FR;

Institut National DE L'environnement Industriel ET Des Risques, Verneuil-en-halatte, FR;

Inventors:

Laïfa Boufendi, Saint Denis en Val, FR;

Laurent Meyer, L'Isle Adam, FR;

Christophe Dutouquet, Senlis, FR;

Emeric Frejafon, Villiers Sous Saint Leu, FR;

Gaétan Wattieaux, Vigoulet-Auzil, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01); G01N 21/71 (2006.01); H05H 1/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01); H05H 1/0037 (2013.01);
Abstract

The invention relates to a method of analyzing particles, in particular particles of diameter less than 1 μm, the method comprising the following steps: A system for detecting and/or analyzing particles by performing the method.


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