L'Isle Adam, France

Laurent Meyer

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Centre National De La Recherche Scientifique, Université D'orleans. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Laurent Meyer. Retrieved from https://idiyas.com/inventor/laurent-meyer-enin8toe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Laurent Meyer

Introduction

Laurent Meyer is a notable inventor based in L'Isle Adam, France. He has made significant contributions to the field of particle analysis, particularly in the context of cold plasma technology. His work has implications for various scientific and industrial applications.

Latest Patents

Laurent Meyer holds a patent for a "Method and system for analyzing particles in cold plasma." This invention focuses on analyzing particles with diameters less than 1 µm. The method involves a system designed for detecting and analyzing these particles effectively.

Career Highlights

Throughout his career, Laurent Meyer has worked with prestigious institutions, including the Centre National de la Recherche Scientifique and the Université d'Orléans. His experience in these organizations has contributed to his expertise in particle analysis and cold plasma research.

Collaborations

Laurent has collaborated with notable colleagues such as Gaétan Wattieaux and Christophe Dutouquet. These partnerships have enhanced his research and development efforts in the field.

Conclusion

Laurent Meyer is a distinguished inventor whose work in particle analysis has paved the way for advancements in cold plasma technology. His contributions continue to influence the scientific community and industry practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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