Vigoulet-Auzil, France

Gaétan Wattieaux

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Centre National De La Recherche Scientifique, Université D'orleans. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gaétan Wattieaux. Retrieved from https://idiyas.com/inventor/gaétan-wattieaux

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Gaétan Wattieaux: Innovator in Particle Analysis

Introduction

Gaétan Wattieaux is a notable inventor based in Vigoulet-Auzil, France. He has made significant contributions to the field of particle analysis, particularly in the context of cold plasma technology. His innovative approach has led to the development of a unique method for analyzing small particles.

Latest Patents

Wattieaux holds a patent for a "Method and system for analyzing particles in cold plasma." This invention focuses on analyzing particles with diameters less than 1 µm. The method involves a system designed for detecting and analyzing these particles effectively.

Career Highlights

Throughout his career, Gaétan Wattieaux has worked with esteemed institutions such as the Centre National de la Recherche Scientifique and the Université d'Orléans. His work in these organizations has allowed him to advance his research and contribute to the scientific community.

Collaborations

Wattieaux has collaborated with notable colleagues, including Laïfa Boufendi and Laurent Meyer. These partnerships have enriched his research and fostered innovation in particle analysis.

Conclusion

Gaétan Wattieaux's contributions to the field of particle analysis through his innovative methods and collaborations highlight his importance as an inventor. His work continues to influence advancements in technology and research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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