Senlis, France

Christophe Dutouquet

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Centre National De La Recherche Scientifique, Université D'orleans. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christophe Dutouquet. Retrieved from https://idiyas.com/inventor/christophe-dutouquet

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Christophe Dutouquet

Introduction

Christophe Dutouquet is a notable inventor based in Senlis, France. He has made significant contributions to the field of particle analysis, particularly in the context of cold plasma technology. His work has implications for various scientific and industrial applications.

Latest Patents

Dutouquet holds a patent for a "Method and system for analyzing particles in cold plasma." This invention focuses on analyzing particles with diameters less than 1 µm. The method involves a system designed for detecting and analyzing these particles effectively.

Career Highlights

Throughout his career, Christophe Dutouquet has worked with prestigious institutions, including the Centre National de la Recherche Scientifique and the Université d'Orléans. His experience in these organizations has allowed him to develop and refine his innovative ideas.

Collaborations

Dutouquet has collaborated with notable colleagues, including Laïfa Boufendi and Emeric Frejafon. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Christophe Dutouquet's work in particle analysis and cold plasma technology showcases his innovative spirit and dedication to scientific advancement. His contributions continue to influence the field and inspire future research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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