Villiers-Sous-Saint-Leu, France

Emeric Frejafon

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignees: Centre National De La Recherche Scientifique, Université D'orleans. Active years: 2016.


 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2016

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Emeric Frejafon: Innovator in Particle Analysis Technology

Introduction

Emeric Frejafon, an inventor based in Villiers-Sous-Saint-Leu, France, has made significant contributions to the field of particle analysis technology. With a focus on innovative methods and systems, Frejafon's work is especially relevant in the context of analyzing microscopic particles.

Latest Patents

Frejafon holds one patent titled "Method and system for analyzing particles in cold plasma." This invention addresses the challenge of analyzing particles with diameters less than 1 micrometer, outlining a method that includes a system for detecting and analyzing these tiny particles effectively.

Career Highlights

Throughout his career, Emeric Frejafon has been affiliated with esteemed institutions such as the Centre National de la Recherche Scientifique and the Université d'Orléans. His roles at these institutions have allowed him to engage in advanced research, enhancing his expertise in particle analysis.

Collaborations

Frejafon has worked alongside notable colleagues, including Laïfa Boufendi and Laurent Meyer. Their collaborative efforts have likely contributed to the advancements seen in his research and patent work.

Conclusion

Emeric Frejafon’s contributions to particle analysis technology exemplify the impact of innovation in scientific research. His single patent reflects a deep understanding of complex analysis methods, which can lead to significant advancements in various scientific applications.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…