The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Sep. 25, 2013
Applicants:

Weng Hong Teh, Cambridge, MA (US);

Tarek a Ibrahim, Mesa, AZ (US);

Sarah K Haney, Cary, NC (US);

Daniel N Sobieski, Phoenix, AZ (US);

Parshuram B Zantye, Morganville, NJ (US);

Chad E Mair, Chandler, AZ (US);

Telesphor Kamgaing, Chandler, AZ (US);

Inventors:

Weng Hong Teh, Cambridge, MA (US);

Tarek A Ibrahim, Mesa, AZ (US);

Sarah K Haney, Cary, NC (US);

Daniel N Sobieski, Phoenix, AZ (US);

Parshuram B Zantye, Morganville, NJ (US);

Chad E Mair, Chandler, AZ (US);

Telesphor Kamgaing, Chandler, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00246 (2013.01); B81C 1/00261 (2013.01); B81C 1/00277 (2013.01); B81B 2201/0271 (2013.01); H01L 2924/01079 (2013.01);
Abstract

Techniques and mechanisms for providing precisely fabricated structures of a semiconductor package. In an embodiment, a build-up carrier of the semiconductor package includes a layer of porous dielectric material. Seed copper and plated copper is disposed on the layer of porous dielectric material. Subsequent etching is performed to remove copper adjacent to the layer of porous dielectric material, forming a gap separating a suspended portion of a MEMS structure from the layer of porous dielectric material. In another embodiment, the semiconductor package includes a copper structure disposed between portions of an insulating layer or portions of a layer of silicon nitride material. The layer of silicon nitride material couples the insulating layer to another insulating layer. One or both of the insulating layers are each protected from desmear processing with a respective release layer structure.


Find Patent Forward Citations

Loading…