The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Sep. 13, 2013
Applicant:

Varian Semiconductor Equipment Associates, Inc., Gloucester, MA (US);

Inventors:

Adam Brand, Palo Alto, CA (US);

Srinivas Nemani, Sunnyvale, CA (US);

John J. Hautala, Beverly, MA (US);

Ludovic Godet, Boston, MA (US);

Yuri Erokhin, Gloucester, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/02 (2006.01); H01L 21/311 (2006.01); H01L 21/3115 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66803 (2013.01); H01L 21/02321 (2013.01); H01L 21/31133 (2013.01); H01L 21/31138 (2013.01); H01L 21/31155 (2013.01);
Abstract

A three-dimensional structure disposed on a substrate is processed so as to alter the etch rate of material disposed on at least one surface of the structure. In some embodiments, a conformal deposition of material is performed on the three-dimensional structure. Subsequently, an ion implant is performed on at least one surface of the three-dimensional structure. This ion implant serves to alter the etch rate of the material deposited on that structure. In some embodiments, the ion implant increases the etch rate of the material. In other embodiments, the ion implant decreases the etch rate. In some embodiments, ion implants are performed on more than one surface, such that the material on at least one surface is etched more quickly and material on at least one other surface is etched more slowly.


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