The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Aug. 31, 2012
Applicants:
Sandeep Ahuja, University Place, WA (US);
Robin A. Steinbrecher, Olympia, WA (US);
Susan F. Smith, Olympia, WA (US);
David J. Ayers, Fremont, CA (US);
Inventors:
Sandeep Ahuja, University Place, WA (US);
Robin A. Steinbrecher, Olympia, WA (US);
Susan F. Smith, Olympia, WA (US);
David J. Ayers, Fremont, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 3/06 (2006.01); H01L 23/34 (2006.01);
U.S. Cl.
CPC ...
G01K 3/06 (2013.01); H01L 23/34 (2013.01); H01L 2924/0002 (2013.01);
Abstract
An apparatus may include an integrated circuit die having a plurality of temperature sensors and a control unit integrated thereon. The control unit can calculate an average die temperature based on readings from the plurality of temperature sensors, compare the average die temperature to a specification temperature and control an off-die cooling system based on the comparison.