The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Jun. 13, 2011
Applicants:

Mitsunori Nakamori, Koshi, JP;

Noritaka Uchida, Koshi, JP;

Takehiko Orii, Nirasaki, JP;

Takanori Miyazaki, Koshi, JP;

Nobuhiko Mouri, Koshi, JP;

Inventors:

Mitsunori Nakamori, Koshi, JP;

Noritaka Uchida, Koshi, JP;

Takehiko Orii, Nirasaki, JP;

Takanori Miyazaki, Koshi, JP;

Nobuhiko Mouri, Koshi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 7/22 (2006.01); B24B 51/00 (2006.01); B24B 37/04 (2012.01);
U.S. Cl.
CPC ...
B24B 37/042 (2013.01);
Abstract

Provided are a rear substrate surface polishing device polishing a rear surface of a substrate, a rear substrate surface polishing system including the rear substrate surface polishing device, a rear substrate surface polishing method used in the rear substrate surface polishing device, and a storage medium for storing a program implemented with the rear substrate surface polishing method. In particular, the rear surface of the substrate is polished by a substrate polishing unit in accordance with information acquired from a prior process performed prior to the polishing process of the rear surface of the substrate at the substrate polishing unit. Further, the substrate polishing unit polishes the substrate with a polishing area determined on the basis of information acquired from a prior process. Furthermore, the polishing is performed by using any one or all of a plurality of substrate polishing units determined on the basis of information acquired from a prior process.


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