The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9029260 B1

PDF
Full Text
Expired
Date of Patent:
May. 12, 2015

Filed:

Jun. 16, 2011
Applicants:

Chun Chieh Lin, Taichung, TW;

Hung-wen Su, Jhubei, TW;

Minghsing Tsai, Chu-Pei, TW;

Syun-ming Jang, Hsin-Chu, TW;

Inventors:

Chun Chieh Lin, Taichung, TW;

Hung-Wen Su, Jhubei, TW;

Minghsing Tsai, Chu-Pei, TW;

Syun-Ming Jang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 21/768 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76885 (2013.01); H01L 23/53238 (2013.01); H01L 21/76807 (2013.01); H01L 21/76834 (2013.01); H01L 2221/1031 (2013.01); H01L 2924/0002 (2013.01);
Abstract

The present disclosure provides a method of fabricating a semiconductor device. The method includes forming a patterned dielectric layer having a plurality of first openings. The method includes forming a conductive liner layer over the patterned dielectric layer, the conductive liner layer partially filling the first openings. The method includes forming a trench mask layer over portions of the conductive liner layer outside the first openings, thereby forming a plurality of second openings, a subset of which are formed over the first openings. The method includes depositing a conductive material in the first openings to form a plurality of vias and in the second openings to form a plurality of metal lines. The method includes removing the trench mask layer.


Find Patent Forward Citations

Lin, Chun. (2015). Gap filling method for dual damascene process (U.S. Patent No. 9029260). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9029260

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