The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Oct. 02, 2012
Applicant:

Korea Food Research Institute, Seongnam-si, KR;

Inventors:

Byeong Sam Kim, Seongnam-si, KR;

Ji Young Kim, Seoul, KR;

Jong Hoon Kim, Seoul, KR;

Ouiwoung Kim, Hwaseong-si, KR;

Ki Hyun Kwon, Suwon-si, KR;

Yoon Sook Kim, Seoul, KR;

Hwan Soo Cha, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G01D 21/00 (2006.01); G06Q 10/08 (2012.01);
U.S. Cl.
CPC ...
G01D 21/00 (2013.01); G06Q 10/0838 (2013.01); G06Q 10/08 (2013.01);
Abstract

A product quality monitoring system includes: an RFID tag which is attached to a first packing container in which a product is packed, and transmits atmospheric history information and an identifier for a product distribution history; a QR code which is attached to a second packing container and stores the identifier and address information of a product quality predicting server; a product distribution history DB which stores the atmospheric history information and the identifier which are received from the RFID tag; a user terminal which connects with the product quality predicting server corresponding to the address information stored in the captured QR code, and requests a quality index of the product; and the product quality predicting server which calculates the quality index of the product or a time when the product has a specific quality index, from the atmospheric history information.


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