The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Dec. 12, 2013
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Pi-Tsung Chen, Zhubei, TW;
Ming-Hui Chih, Luzhou, TW;
Ken-Hsien Hsieh, Taipei, TW;
Wei-Long Wang, Hsinchu, TW;
Wen-Chun Huang, Xi-Gang Village, TW;
Ru-Gun Liu, Hsinchu, TW;
Tsai-Sheng Gau, Hsinchu, TW;
Wen-Ju Yang, Hsinchu, TW;
Gwan Sin Chang, Hsinchu, TW;
Yung-Sung Yen, Taipei County, TW;
Abstract
A method includes determining one or more potential merges corresponding to a color set Aand a color set Aof N color sets, represented by Ato A, used in coloring polygons of a layout of an integrated circuit. N is a positive integer, i and j are integers from 1 to N, and i≠j. One or more potential cuts corresponding to the color set Aand the second color set Aare determined. An index Ais determined according to the one or more potential merges and the one or more potential cuts. A plurality of parameters F related to the index Ais obtained based on various values of indices fand f. A parameter F is selected among the plurality of parameters F based on a definition of the index A.