The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2015

Filed:

Sep. 16, 2008
Applicants:

Fei Chen, Green Brook, NJ (US);

Lorraine Denby, Berkeley Heights, NJ (US);

Wen-hua Ju, Monmouth Junction, NJ (US);

James M. Landwehr, Summit, NJ (US);

Holger Vatter, Buettelborn, DE;

Inventors:

Fei Chen, Green Brook, NJ (US);

Lorraine Denby, Berkeley Heights, NJ (US);

Wen-Hua Ju, Monmouth Junction, NJ (US);

James M. Landwehr, Summit, NJ (US);

Holger Vatter, Buettelborn, DE;

Assignee:

Avaya Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 3/58 (2006.01); H04M 3/36 (2006.01); H04M 3/51 (2006.01); H04M 15/00 (2006.01);
U.S. Cl.
CPC ...
H04M 3/36 (2013.01); H04M 3/51 (2013.01); H04M 15/58 (2013.01); H04M 2215/0188 (2013.01);
Abstract

The system and method identify a plurality of call flow events in a call analysis system. Call statistics are associated with the call flow events. The call flow events are organized into event groups each containing a plurality of call flow events. Once an event group is selected, call statistics for the events of the event group are displayed. In addition, the system and method allow for selection of individual call flow events in order to display calls associated with the events.


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